Functional aspects in the design for testability
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COJOCARU, Ion, EȘANU, Mariana. Functional aspects in the design for testability. In: Microelectronics and Computer Science: The 5th International Conference, Ed. 8, 22-25 octombrie 2014, Chisinau. Chișinău, Republica Moldova: Universitatea Tehnică a Moldovei, 2014, Ediția 8, pp. 295-298. ISBN 978-9975-45-329-5..
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Microelectronics and Computer Science
Ediția 8, 2014
Conferința "Microelectronics and Computer Science"
8, Chisinau, Moldova, 22-25 octombrie 2014

Functional aspects in the design for testability


Pag. 295-298

Cojocaru Ion1, Eșanu Mariana2
 
1 University Politehnica of Bucharest,
2 SC CRIS - INVEST SRL, Bucharest
 
 
Disponibil în IBN: 19 aprilie 2019


Rezumat

Addressing Design for testability of digital structures requires performing complex studies of phenomena at the frontiers of scientific directions as mathematical logic, physics, chemistry, biology. Half a century passed from the moment of issue of Integrated Circuits Design for testability has not yielded the expected results, which confirms the need for a new paradigm based on the principles of the very nature of existence. Creating the design for testability paradigm involves research, analysis, and use of certain functional aspects between logical functions of different structures. This can lead to the creation of new types of elementary structures and properties intrinsic to the development of modern theories and efficient design for testability. Are highlighted and considered various functional forms of logical functions: equivalent, reverse duality complementary. These functional aspects can be considered as a small step towards establishing innovative concepts of the future transition to the new state of knowledge. The paper is based on analysis of reference works in research logic algebra functions and design for testability.

Cuvinte-cheie
design for testability, echivalence, inversion, duality, complementarity, intrinsic properties