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SM ISO690:2012 COJOCARU, Ion, EȘANU, Mariana. Structural aspects in the design for testability. In: Microelectronics and Computer Science: The 5th International Conference, Ed. 8, 22-25 octombrie 2014, Chisinau. Chișinău, Republica Moldova: Universitatea Tehnică a Moldovei, 2014, Ediția 8, pp. 291-294. ISBN 978-9975-45-329-5.. |
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Microelectronics and Computer Science Ediția 8, 2014 |
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Conferința "Microelectronics and Computer Science" 8, Chisinau, Moldova, 22-25 octombrie 2014 | ||||||
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Pag. 291-294 | ||||||
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Means of modern technology is the result of research and also constitutes an essential support in deepening research performance: no electronic microscopes, telescopes, without computers and lasers can be designed current scientific developments. Nontraditional approaches, and risk of major problems oldest and innovative results obtained at the frontiers of knowledge inspires hope in winning a very important scientific bastion: solving riddles logic synthesis aspects of primary structures in the micrometer and nanometer ranges. The transition to a new stage of knowledge involves not only the establishment of principles and original concepts. Equally important is the highlight and preserve the essential elements of the current state of scientific knowledge as a continuous development. The article contains an analysis of the current state of problem solving design for testability. Structural aspects are analyzed represent obstacles to solving the problem addressed (redundancy, fanouts or similar opposite parity signal propagation to logic gate entrances convergence of structural design digital artifacts). Also are highlighted and analyzed a number of structural issues favorable to solve the problem (homogeneity, repetivitatea and regularity). Research into structural, functional and logic is of paramount importance in solving the problem of design for testability of digital structures. |
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Cuvinte-cheie desgn for testability, structural aspects, digital structures, fan out, homogeneity, test generation |
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