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 SM ISO690:2012PERJU, Veacheslav, CASASENT, David P., FESHCHENKO, Valerii, FESHCHENKO, Lubov. Optical-electronic technologies in materials analysis. In: Proceedings of SPIE - The International Society for Optical Engineering, Ed. 16, 31 martie - 1 aprilie 2005, Orlando, Florida. Bellingham, Washington: SPIE, 2005, Ediţia 16, Vol.5816, pp. 315-320. ISBN 0819458015. ISSN 0277-786X. DOI: https://doi.org/10.1117/12.603994 |
| EXPORT metadate: Google Scholar Crossref CERIF DataCite Dublin Core |
 Proceedings of SPIE - The International Society for Optical Engineering Ediţia 16, Vol.5816, 2005 |
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Conferința "Optical Pattern Recognition" 16, Orlando, Florida, Statele Unite ale Americii, 31 martie - 1 aprilie 2005 | ||||||
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| DOI:https://doi.org/10.1117/12.603994 | ||||||
| Pag. 315-320 | ||||||
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It is proposed a new optical electronic approach for effective, simple and non expensive testing of the materials. An optical correlator is used for high speed features extraction, which characterize the distribution of the informational important elements in the crystallographic image. The digital "portrait" of the analyzed material is constructed which is compared with the set of the standard "portraits" on the base of which the level of the quality of the material is determined. The method permits to automate the process of the crystallographic images analyses and to increase the reliability of the results. |
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| Cuvinte-cheie Analysis, Correlator, feature, image, material, Optical-electronic, system |
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