Holographic properties of system chalcogenide glasy semiconductors - Tungsten oxide
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FESHCHENKO, Igor, COSIUC, Vasile, FESHCHENKO, Valerii. Holographic properties of system chalcogenide glasy semiconductors - Tungsten oxide. In: Proceedings of SPIE - The International Society for Optical Engineering, Ed. 1, 3-7 mai 2004, Chisinau. Bellingham, Washington: SPIE, 2005, Vol.5822, pp. 161-165. ISBN 0819458074. ISSN 0277-786X. DOI: https://doi.org/10.1117/12.612311
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Proceedings of SPIE - The International Society for Optical Engineering
Vol.5822, 2005
Conferința "Information Technologies 2004"
1, Chisinau, Moldova, 3-7 mai 2004

Holographic properties of system chalcogenide glasy semiconductors - Tungsten oxide

DOI:https://doi.org/10.1117/12.612311

Pag. 161-165

Feshchenko Igor, Cosiuc Vasile, Feshchenko Valerii
 
T.G. Shevchenko State University of Pridnestrovie, Tiraspol
 
 
Disponibil în IBN: 26 ianuarie 2024


Rezumat

In this article we investigated holographic properties of recording medium on a basis chalcogenide - oxide of tungsten. We have established, that holographic sensitivity of system chalcogenide - oxide of tungsten in two - three times is higher, than at similar system on the basis of pure chalcogenide. We made conclusions about mechanisms of record of the image in this system. Also in article we describe a technique of manufacturing of system chalcogenide - oxide of tungsten.

Cuvinte-cheie
Diffraction, Holographic, image, Recording material, Spectral, system