| Conţinutul numărului revistei |
| Articolul precedent |
| Articolul urmator |
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 SM ISO690:2012SERGEEV, Sergei, ROBU, Stephan V., MESHALKIN, Alexei, YOVU, M.. Stabilization of Diffraction Gratings Recorded in Poly-N-Epoxypropylcarbazole Films Doped with Iodoform. In: High Energy Chemistry, 2023, vol. 57, pp. 264-268. ISSN 0018-1439. DOI: https://doi.org/10.1134/S0018143923030128 |
| EXPORT metadate: Google Scholar Crossref CERIF DataCite Dublin Core |
  High Energy Chemistry |
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| Volumul 57 / 2023 / ISSN 0018-1439 /ISSNe 1608-3148 | ||||||
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| DOI:https://doi.org/10.1134/S0018143923030128 | ||||||
| Pag. 264-268 | ||||||
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| Rezumat | ||||||
In poly-N-epoxypropylcarbazole films containing 10 wt % CHI3 as an additive, diffraction gratings with a period of about 1 μm have been recorded by electron-beam irradiation at various radiation doses. The influence of the duration of storage in the dark of diffraction gratings on their diffraction efficiency has been examined. A postradiation increase in the diffraction efficiency of gratings recorded at relatively low electron radiation doses was observed. The diffraction efficiency values stabilized approximately on the sixth day after recording the diffraction gratings. |
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| Cuvinte-cheie diffraction efficiency, diffraction grating, electron beam recording, poly-N-epoxypropylcarbazole films |
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