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SM ISO690:2012 KAPON, Eli, MEREUTZA, Alexandru, DOROGAN, Andrei, DRĂGUŢAN, Nicolae, VIERU, Tatiana, SYRBU, Nicolae, ZALAMAI, Victor. Interband optical transitions in the region of excitonic resonance in In0.3Ga0.7As/GaAs quantum wells. In: Nanotechnologies and Biomedical Engineering, Ed. 1, 7-8 iulie 2011, Chișinău. Technical University of Moldova, 2011, Editia 1, pp. 142-144. ISBN 978-9975-66-239-0.. |
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Nanotechnologies and Biomedical Engineering Editia 1, 2011 |
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Conferința "International Conference on Nanotechnologies and Biomedical Engineering" 1, Chișinău, Moldova, 7-8 iulie 2011 | ||||||
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Pag. 142-144 | ||||||
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Reflection spectra of In0.3Ga0.7As layers with 8nm thickness with quantum wells limited by GaAs barrier layer with 100nm thickness (bottom) and 9nm (upper) had been measured at S and P polarizations in the interval of photon energies 0.6 – 1.6eV at an incident angle near the normal one (4.5о) and Brewster angle (76 о). Thin absorption lines 0.9021eV, 1.0161eV, 1.1302eV, 1.1973eV, 1.2766eV conditioned by the transitions hh1-e1(1s), lh1-e1(1s), hh2-e2(1s), lh2e-2(1s), hh3-3(1s) and lh3-3e(1s) had been revealed. The intensity of absorption lines changes in the limits 10 – 70%. |
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Cuvinte-cheie quantum wells, optical properties, exciton, resonance |
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DataCite XML Export
<?xml version='1.0' encoding='utf-8'?> <resource xmlns:xsi='http://www.w3.org/2001/XMLSchema-instance' xmlns='http://datacite.org/schema/kernel-3' xsi:schemaLocation='http://datacite.org/schema/kernel-3 http://schema.datacite.org/meta/kernel-3/metadata.xsd'> <creators> <creator> <creatorName>Kapon, E.</creatorName> <affiliation>Ecole Polytechnique Federale de Lausanne, Elveţia</affiliation> </creator> <creator> <creatorName>Mereuţă, A.Z.</creatorName> <affiliation>Ecole Polytechnique Federale de Lausanne, Elveţia</affiliation> </creator> <creator> <creatorName>Dorogan, A.V.</creatorName> <affiliation>Universitatea Tehnică a Moldovei, Moldova, Republica</affiliation> </creator> <creator> <creatorName>Drăguţan, N.</creatorName> <affiliation>Universitatea Tehnică a Moldovei, Moldova, Republica</affiliation> </creator> <creator> <creatorName>Vieru, T.S.</creatorName> <affiliation>Universitatea Tehnică a Moldovei, Moldova, Republica</affiliation> </creator> <creator> <creatorName>Sîrbu, N.N.</creatorName> <affiliation>Universitatea Tehnică a Moldovei, Moldova, Republica</affiliation> </creator> <creator> <creatorName>Zalamai, V.V.</creatorName> <affiliation>Institutul de Fizică Aplicată al AŞM, Moldova, Republica</affiliation> </creator> </creators> <titles> <title xml:lang='en'>Interband optical transitions in the region of excitonic resonance in In0.3Ga0.7As/GaAs quantum wells</title> </titles> <publisher>Instrumentul Bibliometric National</publisher> <publicationYear>2011</publicationYear> <relatedIdentifier relatedIdentifierType='ISBN' relationType='IsPartOf'>978-9975-66-239-0.</relatedIdentifier> <subjects> <subject>quantum wells</subject> <subject>optical properties</subject> <subject>exciton</subject> <subject>resonance</subject> </subjects> <dates> <date dateType='Issued'>2011</date> </dates> <resourceType resourceTypeGeneral='Text'>Conference Paper</resourceType> <descriptions> <description xml:lang='en' descriptionType='Abstract'><p>Reflection spectra of In0.3Ga0.7As layers with 8nm thickness with quantum wells limited by GaAs barrier layer with 100nm thickness (bottom) and 9nm (upper) had been measured at S and P polarizations in the interval of photon energies 0.6 – 1.6eV at an incident angle near the normal one (4.5о) and Brewster angle (76 о). Thin absorption lines 0.9021eV, 1.0161eV, 1.1302eV, 1.1973eV, 1.2766eV conditioned by the transitions hh1-e1(1s), lh1-e1(1s), hh2-e2(1s), lh2e-2(1s), hh3-3(1s) and lh3-3e(1s) had been revealed. The intensity of absorption lines changes in the limits 10 – 70%.</p></description> </descriptions> <formats> <format>application/pdf</format> </formats> </resource>