Photothermal optical losses characterization of channel waveguides
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BERTOLOTTI, Mario, FABBRI, Luciano, LIAKHOU, Gregory, LI VOTI, Roberto, MATERA, A., SIBILIA, Concita, VALENTINO, M.. Photothermal optical losses characterization of channel waveguides. In: Proceedings of SPIE - The International Society for Optical Engineering, Ed. 1, 11-13 aprilie 1994, Lindau. Bellingham, Washington: SPIE, 1994, Vol.2212, pp. 172-181. ISBN 0819415162. ISSN 0277-786X. DOI: https://doi.org/10.1117/12.185108
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Proceedings of SPIE - The International Society for Optical Engineering
Vol.2212, 1994
Conferința "Linear and Nonlinear Integrated Optics"
1, Lindau, Germania, 11-13 aprilie 1994

Photothermal optical losses characterization of channel waveguides

DOI:https://doi.org/10.1117/12.185108

Pag. 172-181

Bertolotti Mario12, Fabbri Luciano12, Liakhou Gregory3, Li Voti Roberto12, Matera A.12, Sibilia Concita12, Valentino M.12
 
1 Sapienza University of Rome,
2 National Institute of Nuclear Physics (INFN), Turin,
3 Kishinau Polytechnical Institut
 
 
Disponibil în IBN: 9 februarie 2024


Rezumat

The photodeflection method applied to the propagation losses characterization in channel waveguides is discussed using two different set-up configurations. 3D and 1D models are presented in order to calculate the photodeflection angle. The effects on the measurement of set-up misalignments are studied. Different ways for determining the propagation losses are shown. Comparison between theoretical and experimental results for Ti:LiNbO3 and a glass channel waveguide is also reported. The method has proven suitable to measure losses as low as 0.2 dB/cm.

Cuvinte-cheie
Engineering controlled terms Integrated optics, Plasma filled waveguides, Waveguides Engineering uncontrolled terms 1-D models, Channel waveguide, Glass channel waveguides, In-channels, Photo-thermal, Photodeflection method, Propagation loss Engineering main heading Electric losses