Photothermal optical losses characterization of channel waveguides
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BERTOLOTTI, Mario, FABBRI, Luciano, LIAKHOU, Gregory, LI VOTI, Roberto, MATERA, A., SIBILIA, Concita, VALENTINO, M.. Photothermal optical losses characterization of channel waveguides. In: Proceedings of SPIE - The International Society for Optical Engineering, Ed. 1, 11-13 aprilie 1994, Lindau. Bellingham, Washington: SPIE, 1994, Vol.2212, pp. 172-181. ISBN 0819415162. ISSN 0277-786X. DOI: https://doi.org/10.1117/12.185108
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Proceedings of SPIE - The International Society for Optical Engineering
Vol.2212, 1994
Conferința "Linear and Nonlinear Integrated Optics"
1, Lindau, Germania, 11-13 aprilie 1994

Photothermal optical losses characterization of channel waveguides

DOI:https://doi.org/10.1117/12.185108

Pag. 172-181

Bertolotti Mario12, Fabbri Luciano12, Liakhou Gregory3, Li Voti Roberto12, Matera A.12, Sibilia Concita12, Valentino M.12
 
1 Sapienza University of Rome,
2 National Institute of Nuclear Physics (INFN), Turin,
3 Kishinau Polytechnical Institut
 
 
Disponibil în IBN: 9 februarie 2024


Rezumat

The photodeflection method applied to the propagation losses characterization in channel waveguides is discussed using two different set-up configurations. 3D and 1D models are presented in order to calculate the photodeflection angle. The effects on the measurement of set-up misalignments are studied. Different ways for determining the propagation losses are shown. Comparison between theoretical and experimental results for Ti:LiNbO3 and a glass channel waveguide is also reported. The method has proven suitable to measure losses as low as 0.2 dB/cm.

Cuvinte-cheie
Engineering controlled terms Integrated optics, Plasma filled waveguides, Waveguides Engineering uncontrolled terms 1-D models, Channel waveguide, Glass channel waveguides, In-channels, Photo-thermal, Photodeflection method, Propagation loss Engineering main heading Electric losses

Dublin Core Export

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<dc:creator>Bertolotti, M.</dc:creator>
<dc:creator>Fabbri, L.</dc:creator>
<dc:creator>Liakhou, G.L.</dc:creator>
<dc:creator>Li Voti, R.</dc:creator>
<dc:creator>Matera, A.</dc:creator>
<dc:creator>Sibilia, C.</dc:creator>
<dc:creator>Valentino, M.</dc:creator>
<dc:date>1994</dc:date>
<dc:description xml:lang='en'><p>The photodeflection method applied to the propagation losses characterization in channel waveguides is discussed using two different set-up configurations. 3D and 1D models are presented in order to calculate the photodeflection angle. The effects on the measurement of set-up misalignments are studied. Different ways for determining the propagation losses are shown. Comparison between theoretical and experimental results for Ti:LiNbO3 and a glass channel waveguide is also reported. The method has proven suitable to measure losses as low as 0.2 dB/cm.</p></dc:description>
<dc:source>Proceedings of SPIE - The International Society for Optical Engineering (Vol.2212) 172-181</dc:source>
<dc:subject>Engineering controlled terms
Integrated optics</dc:subject>
<dc:subject>Plasma filled waveguides</dc:subject>
<dc:subject>Waveguides
Engineering uncontrolled terms
1-D models</dc:subject>
<dc:subject>Channel waveguide</dc:subject>
<dc:subject>Glass channel waveguides</dc:subject>
<dc:subject>In-channels</dc:subject>
<dc:subject>Photo-thermal</dc:subject>
<dc:subject>Photodeflection method</dc:subject>
<dc:subject>Propagation loss
Engineering main heading
Electric losses</dc:subject>
<dc:title>Photothermal optical losses characterization of channel waveguides</dc:title>
<dc:type>info:eu-repo/semantics/article</dc:type>
</oai_dc:dc>