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 SM ISO690:2012ROTARU, Vasile, CHAPURIN, Igor, KORSHAK, Oleg. Reliefographical structures based on doped chalcogenide semiconductors for optical data storage in wide spectral region including X-ray. In: Proceedings of SPIE - The International Society for Optical Engineering, Ed. 3, 1-2 august 2001, San Diego. Bellingham, Washington: SPIE, 2001, Ediția 3, Vol.4508, pp. 171-175. ISBN 0819442224. ISSN 0277-786X. DOI: https://doi.org/10.1117/12.450785 |
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 Proceedings of SPIE - The International Society for Optical Engineering Ediția 3, Vol.4508, 2001 |
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Conferința "Penetrating Radiation Systems and Applications" 3, San Diego, Statele Unite ale Americii, 1-2 august 2001 | ||||||
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| DOI:https://doi.org/10.1117/12.450785 | ||||||
| Pag. 171-175 | ||||||
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We report a non-silver, two-layered semiconductor-thermoplastic structure for visible and X-ray data recording: Photothermoplastic materials (PTPM) consist the chalcogenide glassy semiconductors and polymeric thermoplastic materials. Our researches were aimed to find out a possibility of using the PTPM as recording media for imaging including X-rays. |
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| Cuvinte-cheie Chalcogenide semiconductors, Photothermoplastic materials, Thermoplastics, thin films, X-ray imaging |
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