Optical-electronic moments features-based recognition system controlled by parameters of the input images
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PERJU, Veacheslav, CASASENT, David P., PERJU, Veacheslav, ZAVROTSCHI, Serghei. Optical-electronic moments features-based recognition system controlled by parameters of the input images. In: Proceedings of SPIE - The International Society for Optical Engineering, Ed. 14, 24-25 aprilie 2003, Orlando, Florida. Bellingham, Washington: SPIE, 2003, Ediţia 14, Vol.5106, pp. 241-248. ISSN 0277-786X. DOI: https://doi.org/10.1117/12.501412
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Proceedings of SPIE - The International Society for Optical Engineering
Ediţia 14, Vol.5106, 2003
Conferința "Optical Pattern Recognition"
14, Orlando, Florida, Statele Unite ale Americii, 24-25 aprilie 2003

Optical-electronic moments features-based recognition system controlled by parameters of the input images

DOI:https://doi.org/10.1117/12.501412

Pag. 241-248

Perju Veacheslav1, Casasent David P.2, Perju Veacheslav1, Zavrotschi Serghei1
 
1 Technical University of Moldova,
2 Carnegie Mellon University, Pittsburgh, USA
 
 
Disponibil în IBN: 30 ianuarie 2024


Rezumat

The new methods of invariant pattern recognition (IPR), based on the effective calculation of image moment features are presented. It is described the special purpose multiprocessor computer system, which realizes the proposed methods of IPR. The system is reconfigurable, with the architecture controlled by parameters of the input images.

Cuvinte-cheie
computer system, image, Moment features, Recognition