Both holographic and electron-beam recording in new carbazolyl - Containing photoresists
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ANDRIESH, Andrei, BIVOL, Valeriu, ERSOY, Okan K., ROBU, Stephan V., SERGEEV, Sergei, VLAD, Liudmila. Both holographic and electron-beam recording in new carbazolyl - Containing photoresists. In: Proceedings of SPIE - The International Society for Optical Engineering, Ed. 7, 8-11 septembrie 2003, Constanta. Bellingham, Washington: Cavallioti, 2004, Ediţia 7, Vol.5581, pp. 543-555. ISSN 0277-786X. DOI: https://doi.org/10.1117/12.582924
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Proceedings of SPIE - The International Society for Optical Engineering
Ediţia 7, Vol.5581, 2004
Conferința "Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies"
7, Constanta, Romania, 8-11 septembrie 2003

Both holographic and electron-beam recording in new carbazolyl - Containing photoresists

DOI:https://doi.org/10.1117/12.582924

Pag. 543-555

Andriesh Andrei1, Bivol Valeriu1, Ersoy Okan K.2, Robu Stephan V.1, Sergeev Sergei1, Vlad Liudmila1
 
1 Center of Optoelectronics,
2 PRISM Center and School of Industrial Engineering, Purdue University W. Lafayette
 
 
Disponibil în IBN: 29 ianuarie 2024


Rezumat

Electron-beam and holographic recording of diffraction gratings was processed in the layers of poly-N-poxypropylcarbazole (PEPC) and co-polymers of carbazolylalkylmethacrylate with octylmethacrylate (CAM:OMA) containing additons of CHI3. The dependence of the diffraction efficiency of planar gratings on the recording current was studied. The influence of post-effect and storage in the dark on the diffraction efficiency is considered. By chemical development technique the reflecting relief diffraction gratings are obtained with the diffraction efficiency of 25-30%

Cuvinte-cheie
Carbazolyl, diffraction efficiency, electron beam, Grating, holography, Photoresist, polymer, recording