Structural and optical properties of cadmium sulfide thin films modified by hydrogen annealing
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MATICIUC, Natalia, HIIE, Jaan, MIKLI, Valdek, POTLOG, Tamara, VALDNA, Vello. Structural and optical properties of cadmium sulfide thin films modified by hydrogen annealing. In: Materials Science in Semiconductor Processing, 2014, vol. 26, pp. 169-174. ISSN 1369-8001. DOI: https://doi.org/10.1016/j.mssp.2014.04.031
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Materials Science in Semiconductor Processing
Volumul 26 / 2014 / ISSN 1369-8001 /ISSNe 1873-4081

Structural and optical properties of cadmium sulfide thin films modified by hydrogen annealing

DOI:https://doi.org/10.1016/j.mssp.2014.04.031

Pag. 169-174

Maticiuc Natalia1, Hiie Jaan1, Mikli Valdek1, Potlog Tamara2, Valdna Vello1
 
1 Tallinn University of Technology,
2 Moldova State University
 
 
Disponibil în IBN: 3 noiembrie 2023


Rezumat

This paper provides a systematic study of structural and optical properties of cadmium sulfide (CdS) films annealed under hydrogen (H2) in a wide range of temperatures (200-450 °C) and times (3-120 min). The aim is to present the properties of the CdS film as a function of hydrogen annealing conditions and to discuss the mechanism behind these changes. The stressed cubic lattice of as-deposited CdS film was relaxed by increasing the temperature and the time of H2 annealing. The surface porosity of CdS films revealed the highest temperature and duration applicable to H2 annealing. The dependence of the band gap as a function of annealing conditions is discussed. The origin of changed optical properties accompanying the shrinkage of the lattice is explained by the incorporation of the hydroxide group on the sulfur site in the CdS lattice during the deposition process and its decomposition after 300 °C. A relationship between CdS properties and the decomposition process of Cd(OH)2 to water and CdO during annealing in H2 was established at different low, moderate and high temperatures of annealing.

Cuvinte-cheie
CdS film, optical properties, structural properties, X-ray diffraction