| Conţinutul numărului revistei |
| Articolul precedent |
| Articolul urmator |
 142 0 |
 SM ISO690:2012URSACHI, Veaceslav, TIGINYANU, Ion, SYRBU, Nicolae, ZALAMAI, Victor, HUBBARD, Seth M., PAVLIDIS, Dimitris. Sharp variations in the temperature dependence of optical reflectivity from AlN/GaN heterostructures. In: Semiconductor Science and Technology, 2003, vol. 18, pp. 9-11. ISSN 0268-1242. DOI: https://doi.org/10.1088/0268-1242/18/2/101 |
| EXPORT metadate: Google Scholar Crossref CERIF DataCite Dublin Core |
  Semiconductor Science and Technology |
||||||
| Volumul 18 / 2003 / ISSN 0268-1242 | ||||||
|
||||||
| DOI:https://doi.org/10.1088/0268-1242/18/2/101 | ||||||
| Pag. 9-11 | ||||||
|
||||||
| Rezumat | ||||||
Sharp variations in optical reflectivity were observed when cooling and heating AlN/GaN heterostructures on sapphire substrates between room temperature and 10 K. The reflectivity was found to decrease at a definite temperature Tk in the downward temperature run, and to recover at Tr > Tk in the subsequent upward temperature run. The temperature behaviour of reflectivity exhibits memory on the cooling-heating cycles previously subjected to samples. |
||||||
| Cuvinte-cheie Aluminum nitride, cooling, Gallium nitride, heating, Light reflection, Optoelectronic devices, Thermal effects |
||||||
|
|
|
|
