Sharp variations in the temperature dependence of optical reflectivity from AlN/GaN heterostructures

Ursachi Veaceslav; Tiginyanu Ion; Syrbu Nicolae; Zalamai Victor; Hubbard Seth M.; Pavlidis Dimitris

Conţinutul numărului revistei

Articolul precedent

Articolul urmator

156

SM ISO690:2012

URSACHI, Veaceslav, TIGINYANU, Ion, SYRBU, Nicolae, ZALAMAI, Victor, HUBBARD, Seth M., PAVLIDIS, Dimitris. Sharp variations in the temperature dependence of optical reflectivity from AlN/GaN heterostructures. In: Semiconductor Science and Technology, 2003, vol. 18, pp. 9-11. ISSN 0268-1242. DOI: https://doi.org/10.1088/0268-1242/18/2/101

EXPORT metadate:
Google Scholar
Crossref
CERIF

DataCite
Dublin Core

Semiconductor Science and Technology

Volumul 18 / 2003 / ISSN 0268-1242

Sharp variations in the temperature dependence of optical reflectivity from AlN/GaN heterostructures

DOI:https://doi.org/10.1088/0268-1242/18/2/101

Pag. 9-11

Ursachi Veaceslav¹², Tiginyanu Ion¹², Syrbu Nicolae¹², Zalamai Victor¹², Hubbard Seth M.³, Pavlidis Dimitris³

¹ Institute of Applied Physics, Academy of Sciences of Moldova,
² Technical University of Moldova,
³ University of Michigan

Disponibil în IBN: 31 august 2023

Rezumat

Sharp variations in optical reflectivity were observed when cooling and heating AlN/GaN heterostructures on sapphire substrates between room temperature and 10 K. The reflectivity was found to decrease at a definite temperature T_k in the downward temperature run, and to recover at T_r > T_k in the subsequent upward temperature run. The temperature behaviour of reflectivity exhibits memory on the cooling-heating cycles previously subjected to samples.

Cuvinte-cheie
Aluminum nitride, cooling, Gallium nitride, heating, Light reflection, Optoelectronic devices, Thermal effects

Crossref XML Export

<?xml version='1.0' encoding='utf-8'?>
<doi_batch version='4.3.7' xmlns='http://www.crossref.org/schema/4.3.7' xmlns:xsi='http://www.w3.org/2001/XMLSchema-instance' xsi:schemaLocation='http://www.crossref.org/schema/4.3.7 http://www.crossref.org/schema/deposit/crossref4.3.7.xsd'>
<head>
<doi_batch_id>ibn-186457</doi_batch_id>
<timestamp>1715623676</timestamp>
<depositor>
<depositor_name>Information Society Development Instiute, Republic of Moldova</depositor_name>
<email_address>idsi@asm.md</email_address>
</depositor>
</head>
<body>
<journal>
<journal_metadata>
<full_title>Semiconductor Science and Technology</full_title>
<issn media_type='print'>02681242</issn>
</journal_metadata>
<journal_issue>
<publication_date media_type='print'>
<year>2003</year>
</publication_date>
<issue></issue>
</journal_issue>
<journal_article publication_type='full_text'><titles>
<title>Sharp variations in the temperature dependence of optical reflectivity from AlN/GaN heterostructures</title>
</titles>
<contributors>
<person_name sequence='first' contributor_role='author'>
<given_name>Veaceslav</given_name>
<surname>Ursachi</surname>
</person_name>
<person_name sequence='additional' contributor_role='author'>
<given_name>Ion</given_name>
<surname>Tighineanu</surname>
</person_name>
<person_name sequence='additional' contributor_role='author'>
<given_name>Nicolae</given_name>
<surname>Sîrbu</surname>
</person_name>
<person_name sequence='additional' contributor_role='author'>
<given_name>Victor</given_name>
<surname>Zalamai</surname>
</person_name>
<person_name sequence='additional' contributor_role='author'>
<given_name>Seth Martin</given_name>
<surname>Hubbard</surname>
</person_name>
<person_name sequence='additional' contributor_role='author'>
<given_name>Dimitris</given_name>
<surname>Pavlidis</surname>
</person_name>
</contributors>
<publication_date media_type='print'>
<year>2003</year>
</publication_date>
<pages>
<first_page>9</first_page>
<last_page>11</last_page>
</pages>
<doi_data>
<doi>10.1088/0268-1242/18/2/101</doi>
<resource>http://www.crossref.org/</resource>
</doi_data>
</journal_article>
</journal>
</body>
</doi_batch>