| Conţinutul numărului revistei |
| Articolul precedent |
| Articolul urmator |
 165 0 |
 SM ISO690:2012RUSU, Gheorghe Ioan, DICIU , Mihaela, PÎRGHIE, Cristian, POPA, Eugeniu. Structural characterization and optical properties of ZnSe thin films. In: Applied Surface Science, 2007, vol. 253, pp. 9500-9505. ISSN 0169-4332. DOI: https://doi.org/10.1016/j.apsusc.2007.06.009 |
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  Applied Surface Science |
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| Volumul 253 / 2007 / ISSN 0169-4332 | ||||||
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| DOI:https://doi.org/10.1016/j.apsusc.2007.06.009 | ||||||
| Pag. 9500-9505 | ||||||
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Zinc selenide (ZnSe) thin films (d = 0.11-0.93 μm) were deposited onto glass substrates by the quasi-closed volume technique under vacuum. Their structural characteristics were studied by X-ray diffraction (XRD) and atomic force microscopy (AFM). The experiments showed that the films are polycrystalline and have a zinc blende (cubic) structure. The film crystallites are preferentially oriented with the (1 1 1) planes parallel to the substrate surface. AFM images showed that the films have a grain like surface morphology. The average roughness, R a = 3.3-6.4 nm, and the root mean square roughness, R rms = 5.4-11.9 nm, were calculated and found to depend on the film thickness and post-deposition heat treatment. The spectral dependence of the absorption coefficient was determined from transmission spectra, in the range 300-1400 nm. The values of optical bandgap were calculated from the absorption spectra, E g = 2.6-2.7 eV. The effect of the deposition conditions and post-deposition heat treatment on the structural and optical characteristics was investigated. |
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| Cuvinte-cheie absorption spectra, AFM, thin films, transmission spectra, XRD, Zinc selenide |
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