XRD and XPS of Cd2SnO4 thin films obtained by spray pyrolysis
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POTLOG, Tamara, BOTNARIUC, Vasile, RAEVSKY, Simion, DOBROMIR, Marius, LUCA, Dumitru. XRD and XPS of Cd2SnO4 thin films obtained by spray pyrolysis. In: IFMBE Proceedings: 3rd International Conference on Nanotechnologies and Biomedical Engineering, ICNBME 2015, Ed. 3, 23-26 septembrie 2015, Chişinău. Springer, 2016, Editia 3, Vol.55, pp. 43-46. ISBN 978-981287735-2. ISSN 16800737. DOI: https://doi.org/10.1007/978-981-287-736-9_10
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IFMBE Proceedings
Editia 3, Vol.55, 2016
Conferința "International Conference on Nanotechnologies and Biomedical Engineering"
3, Chişinău, Moldova, 23-26 septembrie 2015

XRD and XPS of Cd2SnO4 thin films obtained by spray pyrolysis

DOI:https://doi.org/10.1007/978-981-287-736-9_10

Pag. 43-46

Potlog Tamara1, Botnariuc Vasile1, Raevsky Simion1, Dobromir Marius2, Luca Dumitru2
 
1 Moldova State University,
2 Alexandru Ioan Cuza University of Iaşi
 
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Disponibil în IBN: 9 ianuarie 2023


Rezumat

Cd2SnO4 thin films with a 1:1 and 1:3 Sn/Cd weight ratio at different substrate temperatures were fabricated by spray pyrolysis. The structural and surface composition of these films by X-ray diffraction (XRD) and X-ray photoelectron spectroscopy (XPS) were investigated. XRD study reveals tetragonal and orthorhombic phases of SnO2 and cubic phase of Cd2SnO4. In all samples the grain size of the crystallites of the SnO2 phase is smaller than that of the Cd2SnO4 phase. The grain size of the crystallites of Cd2SnO4 cubic phase decreases with increasing the substrate temperatures. The full range XPS spectra of all Cd2SnO4 thin films contain the Sn3p, Sn3d, O1s, Cd3d and O2s characteristic peaks.

Cuvinte-cheie
Cd/Sn ratio, Cd2SnO4 thin films, XPS, XRD