Articolul precedent |
Articolul urmator |
176 2 |
Ultima descărcare din IBN: 2024-03-28 06:16 |
SM ISO690:2012 PATSYUK, Vladimir, SPRINCEAN, Galina. A Comparasion of Some Numerical Methods for Semiconductor Device Problem. In: Conference on Applied and Industrial Mathematics: CAIM 2017, 14-17 septembrie 2017, Iași. Chișinău: Casa Editorial-Poligrafică „Bons Offices”, 2017, Ediţia 25, pp. 33-34. ISBN 978-9975-76-247-2. |
EXPORT metadate: Google Scholar Crossref CERIF DataCite Dublin Core |
Conference on Applied and Industrial Mathematics Ediţia 25, 2017 |
||||||
Conferința "Conference on Applied and Industrial Mathematics" Iași, Romania, 14-17 septembrie 2017 | ||||||
|
||||||
Pag. 33-34 | ||||||
|
||||||
Descarcă PDF | ||||||
Rezumat | ||||||
The considered problem consists in determination of semiconductor diode parameters. The mathematical formulation of the problem is based on Drift-Diffusion model [1]. The model is given by a set of equations for three unknown functions: ' - the electrostatic potential, n, p the concentrations for electrons and holes, respectively. These functions ', n, p are to satisfy the following system of nonlinear di erential equations. |
||||||
|