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 SM ISO690:2012GIANCARLO, Pedrini, SCHIEBELBEIN, Antonius, AKIMOVA, Elena, ABASHKIN, Vladimir. Lensless phase imaging microscopy by multiple intensity diffraction pattern. In: Proceedings of SPIE - The International Society for Optical Engineering, 9-20 mai 2022, Bellingham, Washington. Bellingham, Washington USA: SPIE, 2022, Vol.12136, p. 0. ISBN 978-151065148-7. ISSN 0277786X. DOI: https://doi.org/10.1117/12.2620778 |
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 Proceedings of SPIE - The International Society for Optical Engineering Vol.12136, 2022 |
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Conferința "Unconventional Optical Imaging III 2022" Bellingham, Washington, Statele Unite ale Americii, 9-20 mai 2022 | ||||||
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| DOI:https://doi.org/10.1117/12.2620778 | ||||||
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Diffraction limited phase imaging of microscopic reflective and transmitting samples is achieved by processing multiple intensity diffraction pattern (up to 125 patterns). In order to show the potential of the technique, different phase/amplitude microscopic samples were used in the experiments. Coherent and partially coherent illuminations of the sample (using laser and LED light sources) are investigated. |
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| Cuvinte-cheie lensless imaging, phase imaging microscopy, phase retrieval |
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