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 SM ISO690:2012LUNGU, Ion. Structural and composition of Cu-doped ZnTe thin films with different concentrations by immersion in Cu(NO3)2solution. In: Proceedings of the International Semiconductor Conference: CAS, 6-8 octombrie 2021, Sinaia. New Jersey: Institute of Electrical and Electronics Engineers Inc., 2021, Ediția 44, pp. 155-158. ISBN 978-166543571-0. DOI: https://doi.org/10.1109/CAS52836.2021.9604170 |
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 Proceedings of the International Semiconductor Conference Ediția 44, 2021 |
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Conferința "44rd International Semiconductor Conference" Sinaia, Romania, 6-8 octombrie 2021 | ||||||
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| DOI:https://doi.org/10.1109/CAS52836.2021.9604170 | ||||||
| Pag. 155-158 | ||||||
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Undoped and Cu-doped ZnTe thin films were deposited on the glass substrate by closed space sublimation (CSS) technique. The deposited films were immersed in Cu(NO3)2 solution with concentration varying from 4.2•10-3 mol/l to 10.5•10-3 mol/l. X-ray diffraction (XRD) patterns of undoped and Cu-doped ZnTe thin films exhibited polycrystalline behavior with highest sharp peak corresponding to (111) direction as a preferred orientation. The oxidation states of Zn2+, Te2+, Te2-, and Cu2+ through high-resolution X-ray photoelectron spectroscopy (XPS) analyses were revealed. |
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| Cuvinte-cheie CSS, Cu(NO3)2solution, XPS, XRD, ZnTe thin films |
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