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 SM ISO690:2012POPA, Mihail. Aplicarea metodei swanepoel la determinarea indicelui de refracţie al straturilor subţiri policristaline de znsxse1-x. In: Inovaţia: factor al dezvoltării social-economice, 3 martie 2016, Cahul. Cahul, Republica Moldova: Universitatea de Stat „Bogdan Petriceicu Hasdeu” din C, 2016, pp. 246-251. ISBN 978-9975-88-013-8. |
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| Inovaţia: factor al dezvoltării social-economice 2016 | ||||||
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Conferința "Inovaţia: factor al dezvoltării social-economice" Cahul, Moldova, 3 martie 2016 | ||||||
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The transmission spectra of ZnSxSe1-x thin films have been investigated in the spectral range of wavelength 300-1750 nm. With the increase of the concentration of S and reducing the concentration of Se takes place displacement fundamental absorption edge to the smaller wavelength zone. From the transmission spectra, using the „envelope” method proposed by Swanepoel, the refractive index was determined. It is noted that the refractive index decreases both the with the increase of the wavelength of the used electromagnetic radiation, as well as with increasing coefficient x for each of the samples examined. |
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