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SM ISO690:2012
Afisarea articolelor 1-2(2) pentru cuvîntul-cheie "Engineering controlled terms Computer networks"
Chalcogenide glass thin films: Z-Scan measurements of refractive index changes
Michelotti Francesco1, Bertolotti Mario1, Ciumaş Valentin2, Andrieş Andrei2
1 Sapienza University of Rome,
2 Institute of Applied Physics, Academy of Sciences of Moldova
Proceedings of SPIE - The International Society for Optical Engineering
Vol.1773. 1993. Bellingham, Washington. ISSN 0277-786X.
Disponibil online 12 February, 2024. Descarcări-0. Vizualizări-144
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Physics-technological fabrication features and parameters of InP MM-wave Gunn diodes
Arsentiev Ivan1, Beleaev Alexander2, Bobyl A.1, Boltovets N.3, Ivanov V.3, Kovtonyuk V.3, Konakova Raisa2, Kudryk Ya.2, Milenin Viktor2, Tarasov Ilya1, Markovsky E.2, Redko Roman2, Russu Emil4
1 Ioffe Physical-Technical Institute, RAS,
4 Institute of Applied Physics, Academy of Sciences of Moldova
International Crimean Conference "Microwave and Telecommunication Technology"
Ediția 16, Vol.2. 2006. Sevastopol. ISBN 9663220066.
Disponibil online 17 June, 2024. Descarcări-0. Vizualizări-13
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