Afișare rezultate |    SM ISO690:2012 |
Afisarea articolelor 1-6(6) pentru cuvîntul-cheie "failure analysis"
| Power FETs: Failure Analysis (FA) and Reliability Analysis (RA) |
| Băjenescu Titu-Marius12 |
| 1 Military Technical Academy Bucharest, 2 Technical University of Moldova |
| EEA - Electrotehnica, Electronica, Automatica |
| Nr. 3(70) / 2022 / ISSN - /ISSNe 1582-5175 |
| Disponibil online 12 October, 2022. Descarcări-3. Vizualizări-226 |
| Failures analysis of microcircuits |
| Băjenescu Titu-Marius12 |
| 1 Technical University of Moldova, 2 Military Technical Academy Bucharest |
| EEA - Electrotehnica, Electronica, Automatica |
| Nr. 2(67) / 2019 / ISSN - /ISSNe 1582-5175 |
| Disponibil online 15 August, 2019. Descarcări-6. Vizualizări-700 |
| Some reliability aspects of MEMS and NEMS manufacturing |
| Băjenescu Titu-Marius |
| Journal of Engineering Sciences |
| Nr. 2 / 2021 / ISSN 2587-3474 /ISSNe 2587-3482 |
| Disponibil online 15 June, 2021. Descarcări-2. Vizualizări-399 |
| Challenges of nanotechnologies and some reliability aspects |
| Băjenescu Titu-Marius1, Bâzu Marius2 |
| 2 National Institute for Research and Development in Microtechnologies |
| Journal of Engineering Sciences |
| Nr. 2 / 2020 / ISSN 2587-3474 /ISSNe 2587-3482 |
| Disponibil online 3 June, 2020. Descarcări-0. Vizualizări-829 |
| Mems manufacturing and reliability |
| Băjenescu Titu-Marius |
| Journal of Engineering Sciences |
| Nr. 1 / 2019 / ISSN 2587-3474 /ISSNe 2587-3482 |
| Disponibil online 7 May, 2019. Descarcări-5. Vizualizări-1108 |
| Nano metrology aspects of design, simulation, fabrication, testing , reliability and failure analysis of wafer fused VCSEL |
| Iakovlev Vladimir |
| Swiss Federal Institute of Technology Lausanne |
| Nanotechnologies and Biomedical Engineering |
| Editia 1. 2011. . ISBN 978-9975-66-239-0.. |
| Disponibil online 19 July, 2019. Descarcări-42. Vizualizări-512 |
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