Afiliat la Institutul de Fizică a Semiconductorilor al Academiei Naţionale de Ştiinţe a Ucrainei
Characterization of thin film semiconductor heterostructures using interference modes in wide spectral region |
Dmitruk Nicolas , Gorea Oleg , Mikhailik T. , Pidlisnyi E. , Romaniuk Volodymyr , Wagner Thomas |
Proceedings of SPIE - The International Society for Optical Engineering |
Vol.5024. 2003. Bellingham, Washington. SPIE. 223-228. |
Disponibil online 30 January, 2024 |
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