Afișare rezultate |
Afisarea articolelor -19-0(1) pentru cuvîntul-cheie "Charge accumulation"
Numeric modeling and analytical solution of ionizing irradiation induced charge in MOSFET structure oxide |
Rusanovschi Vitalie1, Avram Adrian Adrian2 |
1 State Agency on Intellectual Property of the Republic of Moldova , 2 Politehnica University of Timisoara |
Symposium on Electronics and Telecommunications |
Ediția 11. 2015. New Jersey. ISBN 978-147997265-4. |
Disponibil online 2 June, 2023. Descarcări-0. Vizualizări-294 |
-19-0 of 1