IBN
Închide
Selectează perioada
Print PDF

Prezenţa autorilor din străinătate în revista Journal of Materials Science: Materials in Electronics

Afisarea articolelor: 1-3(3)
2023
1. AYVAZYAN, G., National Polytechnic University of Armenia, Yerevan, Armenia, VASEASHTA, A., Institute for Advanced Sciences and Convergence , Statele Unite ale Americii, GASPARYAN, F., National Polytechnic University of Armenia, Yerevan, Armenia, KHUDAVERDYAN, S., National Polytechnic University of Armenia, Yerevan, Armenia Correction to: Effect of thermal annealing on the structural and optical properties of black silicon (Journal of Materials Science: Materials in Electronics, (2022), 33, 21, (17001-17010), 10.1007/s10854-022-08578-y). Journal of Materials Science: Materials in Electronics. 2023, nr. , 2-1. ISSN 0957-4522 ISSNe 1573-482X.
2022
2. AYVAZYAN, G., National Polytechnic University of Armenia, Yerevan, Armenia, VASEASHTA, A., Institute for Advanced Sciences and Convergence , Statele Unite ale Americii, GASPARYAN, F., National Polytechnic University of Armenia, Yerevan, Armenia, KHUDAVERDYAN, S., National Polytechnic University of Armenia, Yerevan, Armenia Effect of thermal annealing on the structural and optical properties of black silicon. Journal of Materials Science: Materials in Electronics. 2022, nr. , 17010-17001. ISSN 0957-4522 ISSNe 1573-482X.
2019
3. HO, J., University of Saskatchewan, Canada, BECKER, J., University of Saskatchewan, Canada, LEEDAHL , B., University of Saskatchewan, Canada, BOUKHVALOV, D., Nanjing Forestry University, China, ZHIDKOV, I., Уральский федеральный университет имени первого Президента России Б.Н. Ельцина, Rusia, KUKHARENKO, A., Уральский федеральный университет имени первого Президента России Б.Н. Ельцина, Rusia, KURMAEV, E., Ural Branch of the Russian Academy of Sciences, Rusia, CHOLAKH, S., Уральский федеральный университет имени первого Президента России Б.Н. Ельцина, Rusia, GAVRILOV, N., Ural Branch of the Russian Academy of Sciences, Rusia, BRYNZARI, V., dr., MOEWES, A., University of Saskatchewan, Canada Electronic structure and structural defects in 3d-metal doped In2O3. Journal of Materials Science: Materials in Electronics. 2019, nr. 15(30), 14098-14091. ISSN 0957-4522 ISSNe 1573-482X.
 
 

1-3 of 3