Conţinutul numărului revistei |
Articolul precedent |
Articolul urmator |
174 0 |
SM ISO690:2012 AYVAZYAN, G., VASEASHTA, Ashok, GASPARYAN, Ferdinand, KHUDAVERDYAN, Surik. Correction to: Effect of thermal annealing on the structural and optical properties of black silicon (Journal of Materials Science: Materials in Electronics, (2022), 33, 21, (17001-17010), 10.1007/s10854-022-08578-y). In: Journal of Materials Science: Materials in Electronics, 2023, vol. 34, pp. 1-2. ISSN 0957-4522. DOI: https://doi.org/10.1007/s10854-023-11021-5 |
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Journal of Materials Science: Materials in Electronics | |
Volumul 34 / 2023 / ISSN 0957-4522 /ISSNe 1573-482X | |
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DOI:https://doi.org/10.1007/s10854-023-11021-5 | |
Pag. 1-2 | |
Rezumat | |
In the original version of this article, there is an error in Table 1. Unfortunately, the values for Jsc and Voc have been exchanged, i.e., in place of values of Jsc, the values of Voc have been entered. This has been corrected by publishing this correction article. The correct version of Table 1 is provided below. The authors regret for the inconveniences caused to the readers. (Table presented.) Optoelectrical parameters of solar cells Fabrication procedure Voc (mV) Jsc (mA/cm2) FF η (%) η enhancement (%) Reference (pyramidal textured) 624 34.1 0.752 16.0 – Conventional 625 35.7 0.767 17.1 6.8 New 627 36.6 0.770 17.7 10.6 |
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