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 SM ISO690:2012GRIŢKOV, Serghei. π-тестирование с применением LFSR на основе приводимых полиномов. In: Telecommunications, Electronics and Informatics, Ed. 5, 20-23 mai 2015, Chișinău. Chișinău, Republica Moldova: 2015, Ed. 5, pp. 130-131. ISBN 978-9975-45-377-6. |
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| Telecommunications, Electronics and Informatics Ed. 5, 2015 |
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Conferința "Telecommunications, Electronics and Informatics" 5, Chișinău, Moldova, 20-23 mai 2015 | ||||||
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| Pag. 130-131 | ||||||
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In this paper pseudo-ring testing of digital memory with LFSR on bases of reducible polynomial is described. Resolution of this kind of pseudo-ring tests is presented for stuckat and coupled faults, and comparative analysis was performed regarding classical pseudo-ring tests. |
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| Cuvinte-cheie тестирование, резолюция, приводимый полином, связанные неисправности |
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