&pi;-тестирование с применением LFSR на основе приводимых полиномов

Griţkov Serghei

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2019-03-14 15:43

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GRIŢKOV, Serghei. π-тестирование с применением LFSR на основе приводимых полиномов. In: Telecommunications, Electronics and Informatics, Ed. 5, 20-23 mai 2015, Chișinău. Chișinău, Republica Moldova: 2015, Ed. 5, pp. 130-131. ISBN 978-9975-45-377-6.

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Telecommunications, Electronics and Informatics
Ed. 5, 2015

Conferința "Telecommunications, Electronics and Informatics"
5, Chișinău, Moldova, 20-23 mai 2015

π-тестирование с применением LFSR на основе приводимых полиномов

Pag. 130-131

Griţkov Serghei

Universitatea Tehnică a Moldovei

Disponibil în IBN: 20 mai 2018

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Rezumat

In this paper pseudo-ring testing of digital memory with LFSR on bases of reducible polynomial is described. Resolution of this kind of pseudo-ring tests is presented for stuckat and coupled faults, and comparative analysis was performed regarding classical pseudo-ring tests.

Cuvinte-cheie
тестирование, резолюция,

приводимый полином, связанные неисправности

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