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 SM ISO690:2012DEMIDENKO, I.. Автоматизация процесса измерения оптических и фотоэлектрических свойств полупроводников. In: Telecommunications, Electronics and Informatics, Ed. 5, 20-23 mai 2015, Chișinău. Chișinău, Republica Moldova: 2015, Ed. 5, pp. 128-129. ISBN 978-9975-45-377-6. |
| EXPORT metadate: Google Scholar Crossref CERIF DataCite Dublin Core |
| Telecommunications, Electronics and Informatics Ed. 5, 2015 |
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Conferința "Telecommunications, Electronics and Informatics" 5, Chișinău, Moldova, 20-23 mai 2015 | ||||||
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| Pag. 128-129 | ||||||
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Measuring complex on the basis of УМ-2 monochromator and microcontroller Mega 8 was built; there was organized 10-bit word algorithm transfer on interface RS-232, there was carried out the possibility of automatic transition to a rough measuring mode, and the software for the management and control installation was written |
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| Cuvinte-cheie Микроконтроллер, пин, порт, энкодер, аналого-цифровой преобразователь |
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