<?xml version='1.0' encoding='utf-8'?>
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<creators>
<creator>
<creatorName>Demidenko, I.V.</creatorName>
<affiliation>Universitatea din Tiraspol „T.G. Şevcenko” , Moldova, Republica</affiliation>
</creator>
</creators>
<titles>
<title xml:lang='ru'>Автоматизация процесса измерения оптических и фотоэлектрических свойств полупроводников</title>
</titles>
<publisher>Instrumentul Bibliometric National</publisher>
<publicationYear>2015</publicationYear>
<relatedIdentifier relatedIdentifierType='ISBN' relationType='IsPartOf'>978-9975-45-377-6</relatedIdentifier>
<subjects>
<subject>Микроконтроллер</subject>
<subject>пин</subject>
<subject>порт</subject>
<subject>аналого-цифровой преобразователь</subject>
<subject>энкодер</subject>
</subjects>
<dates>
<date dateType='Issued'>2015</date>
</dates>
<resourceType resourceTypeGeneral='Text'>Conference Paper</resourceType>
<descriptions>
<description xml:lang='en' descriptionType='Abstract'><p>Measuring complex on the basis of УМ-2 monochromator and microcontroller Mega 8 was built; there was organized 10-bit word algorithm transfer on interface RS-232, there was carried out the possibility of automatic transition to a rough measuring mode, and the software for the management and control installation was written</p></description>
</descriptions>
<formats>
<format>application/pdf</format>
</formats>
</resource>