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 SM ISO690:2012VERJBITCHII, V., MARTÎNIUC, Alexei. The method of measuring the parameters of nanostructured sensors. In: Electronics, Communications and Computing, Ed. 12, 20-21 octombrie 2022, Chişinău. Chișinău: Tehnica-UTM, 2023, Editia 12, pp. 94-97. DOI: https://doi.org/10.52326/ic-ecco.2022/EL.06 |
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| Electronics, Communications and Computing Editia 12, 2023 |
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Conferința "Electronics, Communications and Computing" 12, Chişinău, Moldova, 20-21 octombrie 2022 | |||||||
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| DOI:https://doi.org/10.52326/ic-ecco.2022/EL.06 | |||||||
| Pag. 94-97 | |||||||
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In this paper, the data obtained from the research on the development of methods for measuring the parameters of nanostructured sensors, which is based on the use of 2 amplifiers and 2 analog-digital converters for measuring the voltages at the reference voltage source and the voltage drop on the additional resistor, which eliminates the shunt effect of the resistance of the structures investigated by the resistance input of the amplifier. |
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| Cuvinte-cheie nanostructured sensors, reference voltage, input impedance |
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