Afiliat la Institutul de Fizică Aplicată al AŞM
| Photocapacitance relaxation and rigidity transition in Ge xAsxSe1-2x amorphous films |
| Vasiliev Ion , Iovu Mihail , Colomeico Eduard |
| Proceedings of the International Semiconductor Conference CAS |
| Vol. 2. 2010. New Jersey. Institute of Electrical and Electronics Engineers Inc.. 349-352. |
| Disponibil online 12 December, 2023 |
| Optical absorption and photoconductivity of As2Se3:Sn and Sb2Se3:Sn thin film structures |
| Iovu Maria , Iovu Mihail , Vasiliev Ion , Harea Diana , Cojocaru Ion , Colomeico Eduard , Spotiuc Oleg |
| Proceedings of SPIE - The International Society for Optical Engineering |
| Ediţia 4, Vol.7297. 2009. Bellingham, Washington. SPIE. 1-5. |
| Disponibil online 1 December, 2023 |
| Ageing phenomena in thin amorphous AsxSe100-x films |
| Iovu Mihail , Vasiliev Ion , Spotiuc Oleg |
| Journal of Optoelectronics and Advanced Materials |
| Vol. 11, / 2009 / ISSN 1454-4164 |
| Disponibil online 26 February, 2024 |
| Dielectric relaxation in As10Se90 amorphous film near the glass transition temperature |
| Iovu Mihail , Vasiliev Ion , Spotiuc Oleg |
| Proceedings of the International Semiconductor Conference CAS |
| Vol. 2. 2009. New Jersey. Institute of Electrical and Electronics Engineers Inc.. 371-374. |
| Disponibil online 12 December, 2023 |
| Negative photoconductivity of amorphous Sb2Se3 and Sb2Se3:Sn films |
| Iovu Mihail , Vasiliev Ion , Colomeico Eduard |
| Proceedings of the International Semiconductor Conference CAS |
| Vol. 1, Ediția 30. 2007. New Jersey. Institute of Electrical and Electronics Engineers Inc.. 219-222. |
| Disponibil online 24 November, 2023 |
| Photoconductivity of the amorphous As2Se3 film in the medium infrared range |
| Iovu Mihail , Vasiliev Ion , Colomeico Eduard |
| Proceedings of the International Semiconductor Conference CAS |
| Vol. 1, Ediția 29. 2006. New Jersey. Institute of Electrical and Electronics Engineers Inc.. 145-148. |
| Disponibil online 22 November, 2023 |
| Transient photocurrent in α-As2Se3 thin films with optical bias |
| Iovu Maria , Harea Diana , Vasiliev Ion , Colomeico Eduard , Iovu Mihail |
| Proceedings of SPIE - The International Society for Optical Engineering |
| Ediţia 2, Vol.5972. 2005. Bellingham, Washington. Cavallioti. 1-8. |
| Disponibil online 26 January, 2024 |
| Photocapacitance relaxation in amorphous As2Se3 and As2Se3: Sn films |
| Vasiliev Ion , Iovu Mihail , Miroviţkii Vadim , Colomeico Eduard , Harea Diana |
| Proceedings of the International Semiconductor Conference CAS |
| Vol. 1, Ediția 28. 2005. New Jersey. Institute of Electrical and Electronics Engineers Inc.. 133-136. |
| Disponibil online 22 November, 2023 |
| Persistent photoconductivity effect in amorphous As2Se3:Sn thin films |
| Vasiliev Ion , Harea Diana , Colomeico Eduard , Iovu Mihail |
| Proceedings of the International Semiconductor Conference CAS |
| Vol. 1, Ediția 26. 2003. New Jersey. Institute of Electrical and Electronics Engineers Inc.. 143-146. |
| Disponibil online 28 November, 2023 |
| Amorphous, glassy and porous semiconductors: Photocapacitance relaxation in amorphous As2Se3 films |
| Vasiliev Ion , Shutov Serghei |
| Semiconductors |
| Vol. 33, / 1999 / ISSN 1063-7826 |
| Disponibil online 16 October, 2023 |
| Study of optical absorption in thin films of a-As2Se3 by photocapacitance spectroscopy |
| Vasiliev Ion , Shutov Serghei |
| Semiconductors |
| Vol. 32, / 1998 / ISSN 1063-7826 |
| Disponibil online 16 October, 2023 |
| Spectroscopical study of amorphous AsSe films containing tin impurity |
| Iovu Mihail , Popescu Mihai A. , Sîrbu Nicolae , Shutov Serghei , Vasiliev Ion , Rebeja S. , Colomeico Eduard |
| Proceedings of the International Semiconductor Conference CAS |
| Vol. 1. 1998. New Jersey. Institute of Electrical and Electronics Engineers Inc.. 105-108. |
| Disponibil online 5 December, 2023 |
| Transient photocapacitance spectroscopy of Al-As2Se3 junction |
| Shutov Serghei , Vasiliev Ion |
| Proceedings of the International Semiconductor Conference CAS |
| Vol. 2. 1996. New Jersey. Institute of Electrical and Electronics Engineers Inc.. 463-466. |
| Disponibil online 6 December, 2023 |
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