Formation of metal wire arrays via electrodeposition in pores of Si, Ge and III-V semiconductors
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FANG, Cheng, FOCA, Eugen, SIRBU, Lilian, CARSTENSEN, Juergen, FOLL, Helmut, TIGINYANU, Ion. Formation of metal wire arrays via electrodeposition in pores of Si, Ge and III-V semiconductors. In: Physica Status Solidi (A) Applications and Materials Science, 2007, vol. 204, pp. 1388-1393. ISSN 1862-6300. DOI: https://doi.org/10.1002/pssa.200674352
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Physica Status Solidi (A) Applications and Materials Science
Volumul 204 / 2007 / ISSN 1862-6300

Formation of metal wire arrays via electrodeposition in pores of Si, Ge and III-V semiconductors

DOI:https://doi.org/10.1002/pssa.200674352

Pag. 1388-1393

Fang Cheng1, Foca Eugen123, Sirbu Lilian32, Carstensen Juergen1, Foll Helmut1, Tiginyanu Ion32
 
1 Christian-Albrechts University of Kiel,
2 Technical University of Moldova,
3 Institute of Applied Physics, Academy of Sciences of Moldova
 
 
Disponibil în IBN: 10 aprilie 2018


Rezumat

Deep straight macropores in n-type Si have been completely filled with copper (Cu). Homogeneous metal deposition inside the deep pores was achieved by means of electroplating using a solution containing only CuSO 4 mixed with H 2SO 4 and an optimized process that begins at the bottom of the pores. Pores as deep as 150 iμm could be filled without encountering the so-called "bottleneck" effect. Straight macropores with diameters below 100 nm and extreme aspect ratios in InP could be filled with Cu using a pulsed process. Interconnected pores extending in the available set of (111) directions in {100} GaAs and forming domains could not be filled with Cu; instead the volume occupied by the pore domain was completely filled with Cu; i.e. the porous structure was destroyed. A possible reason for this new effect will be given.

Cuvinte-cheie
Metal deposition, Pore domain, Pulsed process, Straight macropores

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<publicationYear>2007</publicationYear>
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<subject>Metal deposition</subject>
<subject>Pore domain</subject>
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<description xml:lang='en' descriptionType='Abstract'><p>Deep straight macropores in n-type Si have been completely filled with copper (Cu). Homogeneous metal deposition inside the deep pores was achieved by means of electroplating using a solution containing only CuSO <sub>4</sub> mixed with H <sub>2</sub>SO <sub>4</sub> and an optimized process that begins at the bottom of the pores. Pores as deep as 150 i&mu;m could be filled without encountering the so-called &quot;bottleneck&quot; effect. Straight macropores with diameters below 100 nm and extreme aspect ratios in InP could be filled with Cu using a pulsed process. Interconnected pores extending in the available set of (111) directions in {100} GaAs and forming domains could not be filled with Cu; instead the volume occupied by the pore domain was completely filled with Cu; i.e. the porous structure was destroyed. A possible reason for this new effect will be given.</p></description>
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