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 SM ISO690:2012НАСИРОВ, А.. Плотность поверхностных состояний на границе раздела полупроводник-стекло. In: Электронная обработка материалов, 2008, nr. 4(44), pp. 102-104. ISSN 0013-5739. |
| EXPORT metadate: Google Scholar Crossref CERIF DataCite Dublin Core |
 Электронная обработка материалов |
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| Numărul 4(44) / 2008 / ISSN 0013-5739 /ISSNe 2345-1718 | ||||||
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| Pag. 102-104 | ||||||
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The method of determination of surface state density at semiconductor-glass interface of MISstructure is offered. It is shown, that the method of differentiation of C-V-dependence is more exact and unequivocal, and also less labour-intensive in comparison with known methods. |
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