Lead chalcogenide IR-emitters and detectors on Si-substrates
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ZOGG, H., ARNOLD, M., ZIMIN, D., ALCHALABI, K., KELLERMANN, K.. Lead chalcogenide IR-emitters and detectors on Si-substrates. In: Moldavian Journal of the Physical Sciences, 2006, nr. 1(5), pp. 88-96. ISSN 1810-648X.
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Moldavian Journal of the Physical Sciences
Numărul 1(5) / 2006 / ISSN 1810-648X /ISSNe 2537-6365

Lead chalcogenide IR-emitters and detectors on Si-substrates


Pag. 88-96

Zogg H., Arnold M., Zimin D., Alchalabi K., Kellermann K.
 
Thin Film Physics Group, Swiss Federal Institute of Technology
 
 
Disponibil în IBN: 17 decembrie 2013


Rezumat

Narrow gap IV-VI (lead chalcogenide) compounds are employed since long time as mid-IR-detectors and -lasers. IV-VIs are tolerant to structural defects (dislocations). This allows lattice mismatched MBE-growth on foreign substrates like Si which offers significant advantages with respect to size, costs and thermal conductivities. In addition, IV-VIs are unique as regards design of Bragg mirrors because of the very high index contrast between IV-VI materials (nH = 4-5) and BaF2 (nL=1.43). A few pairs of quarter wavelength nH/nL-stacks suffice to obtain very high reflectivities R>99%. We review some of our results for different devices: Infrared sensor arrays for thermal imaging on active Si read-out chips, RCEDs (resonant cavity enhanced IR detectors), optically pumped PbSe/Pb1-xEuxSe edge emitting DH (double heterostructure) or QW (quantum well) lasers on Si substrates and “wavelength transformers”, VCSEL (vertical cavity surface emitting laser) structures operated in sub-threshold.