On the photodeflection method applied to low thermal diffusivity measurements
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BERTOLOTTI, Mario, LI VOTI, Roberto, LIAKHOU, Gregory, SIBILIA, Concita. On the photodeflection method applied to low thermal diffusivity measurements. In: Review of Scientific Instruments, 1993, vol. 64, pp. 1576-1583. ISSN 0034-6748. DOI: https://doi.org/10.1063/1.1144029
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Review of Scientific Instruments
Volumul 64 / 1993 / ISSN 0034-6748 /ISSNe 1089-7623

On the photodeflection method applied to low thermal diffusivity measurements

DOI:https://doi.org/10.1063/1.1144029

Pag. 1576-1583

Bertolotti Mario12, Li Voti Roberto12, Liakhou Gregory3, Sibilia Concita1
 
1 Sapienza University of Rome,
2 GNEQP, CNR, Italy,
3 Kishinau Polytechnical Institut
 
 
Disponibil în IBN: 19 iunie 2024


Rezumat

The photodeflection method when applied to measure the low thermal diffusivity of some materials gives inconsistent results. In this article a way to extend the thermal diffusivity range of measurements using the phase of the photodeflection signal is presented. A comparison with computer simulations and experimental results shows good agreement.