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 SM ISO690:2012SIDORENKO, Anatolie, ZDRAVKOV, Vladimir, PREPELITSA, Andrei, HELBIG, Christoph, LUO, Yuansu, GSELL, Stefan, SCHRECK, Matthias, KLIMM, S., HÖRN, Siegfried, TAGIROV, Lenar, TIDECKS, Reinhard. Oscillations of the critical temperature in superconducting Nb/Ni bilayers. In: Annalen der Physik, 2003, vol. 12, pp. 37-50. ISSN 0003-3804. DOI: https://doi.org/10.1002/andp.200310005 |
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  Annalen der Physik |
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| Volumul 12 / 2003 / ISSN 0003-3804 /ISSNe 1521-3889 | |
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| DOI:https://doi.org/10.1002/andp.200310005 | |
| Pag. 37-50 | |
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We investigated Nb/Ni bilayers prepared by magnetron sputtering on glass substrates. The quality of the films was characterized by small-angle X-ray diffraction analysis. The thickness of the layers was determined by the Rutherford backscattering spectrometry (RBS). For specimens with constant Nb layer thickness we observed distinct oscillations of the superconducting critical temperature upon increasing the thickness of the Ni layer. The results are interpreted in terms of Fulde-Ferrell-Larkin-Ovchinnikov (FFLO) like inhomogeneous superconducting pairing in the ferromagnetic Ni Layer. |
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| Cuvinte-cheie Ferromagnetic materials, magnetron sputtering, Molecular beam epitaxy, nickel, Niobium, Rutherford backscattering spectroscopy, Superconducting films, Thickness measurement, X ray diffraction analysis |
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