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 SM ISO690:2012PRISLOPSKI, Sergey, TIGINYANU, Ion, GHIMPU, Lidia, MONAICO, Eduard, SIRBU, Lilian, AUTOR, Nou, GAPONENCO, Sergey. Retroreflection from disordered porous semiconductors. In: International Conference on Transparent Optical Networks, Ed. 13, 26-30 iunie 2011, Stockholm. New Jersey: Institute of Electrical and Electronics Engineers Inc. (IEEE), 2011, Ediţia 13, pp. 1-4. ISBN 978-145770880-0. ISSN 21627339. DOI: https://doi.org/10.1109/ICTON.2011.5970957 |
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 International Conference on Transparent Optical Networks Ediţia 13, 2011 |
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Conferința "13th International Conference on Transparent Optical Networks" 13, Stockholm, Suedia, 26-30 iunie 2011 | |
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| DOI:https://doi.org/10.1109/ICTON.2011.5970957 | |
| Pag. 1-4 | |
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Prominent retroreflection is experimentally observed in disordered porous InP membranes. It is believed to be the result of an interplay between Fresnel-like and Bragg-like reflection for different components of an impinging wave vector, mediated by pronounced disorder and high material absorption. Retroreflection is seen to be stronger than Fresnel reflection and visible with the naked eye. The observed effect is broadband in wavelength, present in a wide range of incident angles, and (unique Fresnel reflection) largely polarization independent. It can be of use in a novel design of miniature retroreflecting optical components. |
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| Cuvinte-cheie disorder, Fresnel reflections, Incident angles, Material absorption, Microporous, Naked-eye, Novel design, Optical components, photonic nanostructures, Polarization independent, Porous InP, Porous semiconductors, Retro reflection, Retro-reflecting, Wave vector |
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