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 SM ISO690:2012DYNTU, M., NIKORICH, Andrey V.. Pb1-xMnxTe〈In〉 crystals microhardness investigation. In: Proceedings of the International Semiconductor Conference: CAS, Ed. 18, 11-14 octombrie 1995, Sinaia. New Jersey: Institute of Electrical and Electronics Engineers Inc., 1995, pp. 383-385. DOI: https://doi.org/10.1109/SMICND.1995.495041 |
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| Proceedings of the International Semiconductor Conference 1995 | ||||||
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Conferința "International Semiconductor Conference" 18, Sinaia, Romania, 11-14 octombrie 1995 | ||||||
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| DOI:https://doi.org/10.1109/SMICND.1995.495041 | ||||||
| Pag. 383-385 | ||||||
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Microhardness and dislocation mobility in Pb1-xMnx〈In〉 crystals are investigated in dependence on composition x and temperature T. Manganese content increase is shown to lead to crystals hardening. |
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| Cuvinte-cheie Composition effects, Dislocations (crystals), hardness, manganese, Thermal effects |
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