Articolul precedent |
Articolul urmator |
175 0 |
SM ISO690:2012 TSIULYANU, A., MARIAN, Svetlana, PUSHCACH, B., TSIULYANU , Dumitru, LIESS, Hans Dieter. Nitrogen dioxide sensing properties of tellurium based films by thermal treatment. In: Proceedings of the International Semiconductor Conference: CAS, Ed. 26, 28 septembrie - 2 octombrie 2003, Sinaia. New Jersey: Institute of Electrical and Electronics Engineers Inc., 2003, Vol. 1, Ediția 26, pp. 197-200. ISBN 0780378210. DOI: https://doi.org/10.1109/SMICND.2003.1251376 |
EXPORT metadate: Google Scholar Crossref CERIF DataCite Dublin Core |
Proceedings of the International Semiconductor Conference Vol. 1, Ediția 26, 2003 |
||||||
Conferința "26th International Semiconductor Conference" 26, Sinaia, Romania, 28 septembrie - 2 octombrie 2003 | ||||||
|
||||||
DOI:https://doi.org/10.1109/SMICND.2003.1251376 | ||||||
Pag. 197-200 | ||||||
|
||||||
Descarcă PDF | ||||||
Rezumat | ||||||
Influence of annealing on the electrical and sensing properties toward NO2 of tellurium based films were investigated. The annealing at temperatures more than 100°C causes a sharp decrease both of electrical resistance and sensitivity of the films. SEM analyzes indicated the annealing-induced structural evolution of the films, including the growing of large crystals incorporated into basic matrix. The results are discussed taking into concentration the intrinsic character of conductivity typical for used films, which can be modified in a dopant-like one at a semiconductor surface. It is assumed the surface hole-enriched region to be formed as a result of dangling bond-chalcogen's lone-pair electron interaction. Chemisorption of NO2 molecules is accompanied by holes enrichment of the surface like-dopant region, due to interaction of these molecules with lone-pair electrons. |
||||||
Cuvinte-cheie Annealing, Charge carrier processes, Conductive films, conductivity, Crystals, Electric resistance, Nitrogen, Semiconductor films, Tellurium, temperature sensors |
||||||
|