The transverse photothermal deflection configuration, which uses the probe beam reflected from the sample surface (bouncing scheme), has been investigated and the theoretical equations governing the probe beam deflection have been derived. In particular the role of the probe beam incidence angle has been studied and found to be analogous to that played by the probe beam vertical height when the photothermal deflection technique is applied in the skimming scheme. A substantial analogy between the two experimental schemes has been found by comparing the deflection signal dependence on the probe incidence angle and on the probe height. To demonstrate the theory, photothermal deflection experiments have been performed on an invar specimen that, owing to its low thermal expansion coefficient, allowed us to neglect the contribution coming from thermally induced surface displacement in a restricted incidence angle range.