| Articolul precedent |
| Articolul urmator |
 |
 292 0 |
 SM ISO690:2012ROSSINYOL, Emma, ARBIOL, Jordi, PEIRO, Francesca, CORNET, Albert, MORANTE, J. R., BRYNZARI, Vladimir, KOROTCHENKOV, Ghenadii, GOLOVANOV, Vyacheslav. Modelling and HRTEM computer simulation of facetting of SnO2 nanostructures deposited by spray pyrolysis on glass substrates. In: Microscopy of Semiconducting Materials 2003, 1 ianuarie 2018, Boca Raton, Florida. Boca Raton, Florida, Statele Unite: CRC Press, 2018, pp. 79-82. ISBN 978-135108308-9, 0750309792, 978-131589553-6. DOI: https://doi.org/10.1201/9781351074636 |
| EXPORT metadate: Google Scholar Crossref CERIF DataCite Dublin Core |
 Microscopy of Semiconducting Materials 2003 2018 |
|
|
Sesiunea "Microscopy of Semiconducting Materials 2003" Boca Raton, Florida, Statele Unite ale Americii, 1 ianuarie 2018 | |
|
|
| DOI:https://doi.org/10.1201/9781351074636 | |
| Pag. 79-82 | |
| Vezi articolul | |
| Rezumat | |
SnO2 thin films grown by spray pyrolysis on glass substrates have been studied. The evolution of the crystallographic orientation of these films (35-300nm) with the variation of the pyrolysis temperature (300°c - 530°C) is reported. Samples have been characterised by X-ray diffraction and high resolution transmission electron microscopy. Some atomic models of grain growth for each pyrolysis temperature have been proposed. These models have been tested by computer image simulation in order to compare with the experimental images. |
|
| Cuvinte-cheie glass, Grain growth, High resolution transmission electron microscopy, Substrates |
|
|
|
|
|
