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SM ISO690:2012

Ultraviolet Raman microscopy of single and multilayer graphene

Calizo Irene G.12, Bejenari Igor13, Rahman uhammad Mustafizur Mizanur Hafizur1, Liu Guanxiong1, Balandin Alexander A.1

1 University of California, Riverside, 3 Institute of Electronic Engineering and Industrial Technologies, Academy of Sciences of Moldova

Journal of Applied Physics

Nr. / 2009 / ISSN 0021-8979 /ISSNe 1089-7550

Disponibil online 6 July, 2023. Descarcări-3. Vizualizări-167

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Nano metrology aspects of design, simulation, fabrication, testing , reliability and failure analysis of wafer fused VCSEL

Iakovlev Vladimir

Swiss Federal Institute of Technology Lausanne

Nanotechnologies and Biomedical Engineering

Editia 1. 2011. . ISBN 978-9975-66-239-0..

Disponibil online 19 July, 2019. Descarcări-42. Vizualizări-526

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