Afiliat la Université Montpellier II
Silicon versus III-V semiconductor material choice for terahertz imaging with nanometerfield effect transistors based detectors |
Knap Wojciech , Coquillat D. , Diakonova N. , Teppe Frederic |
Materials Science and Condensed Matter Physics |
Editia 5. 2010. Chișinău, Republica Moldova. Institutul de Fizică Aplicată. 27-27. |
Disponibil online 12 April, 2021 |
1-1 of 1