Afisarea articolelor 1-2(2) pentru cuvîntul-cheie "Electric conductivity" , Anul: 2004
| Analytical test of the film/substrate boundary perfection in SnO 2 thin films |
| Ivashchenko Anatolii, Cherner Iacov |
| Institute of Applied Physics, Academy of Sciences of Moldova |
| Proceedings of the International Semiconductor Conference |
| Vol. 2, Ediția 27. 2004. New Jersey. . |
| Disponibil online 27 November, 2023. Descarcări-0. Vizualizări-134 |
| Effect of temperature on the NO2 sensing properties of tellurium based films |
| Tiuleanu A1, Ţiuleanu Dumitru1, Liess Hans Dieter2 |
| 1 Technical University of Moldova, 2 The Bundeswehr University Munich |
| Proceedings of the International Semiconductor Conference |
| Vol. 2, Ediția 27. 2004. New Jersey. . |
| Disponibil online 27 November, 2023. Descarcări-0. Vizualizări-114 |
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