Afisarea articolelor 1-1(1) pentru cuvîntul-cheie "raster scan patterns" , Anul: 2015
Electron-beam recording of patterns in chalcogenide films |
Sergheev Serghei, Iovu Mihail, Iaseniuc Oxana |
Institute of Applied Physics, Academy of Sciences of Moldova |
Proceedings of SPIE - The International Society for Optical Engineering |
Ediţia 7, Vol.9258. 2015. Bellingham, Washington. ISSN 0277786X. |
Disponibil online 17 May, 2023. Descarcări-5. Vizualizări-222 |
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