Afișare rezultate

SM ISO690:2012

Numeric modeling and analytical solution of ionizing irradiation induced charge in MOSFET structure oxide

Rusanovschi Vitalie1, Avram Adrian Adrian2

1 State Agency on Intellectual Property of the Republic of Moldova , 2 Politehnica University of Timisoara

Symposium on Electronics and Telecommunications

Ediția 11. 2015. New Jersey. ISBN 978-147997265-4.

Disponibil online 2 June, 2023. Descarcări-0. Vizualizări-270

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Properties of SiO2 thin films prepared by anodic oxidation under UV illumination and rapid photothermal processing

Şişianu Sergiu, Lupan Oleg, Şişianu Teodor, Şontea Victor, Railean Serghei

Technical University of Moldova

Electrochimica Acta

Nr. / 2004 / ISSN 0013-4686

Disponibil online 16 January, 2024. Descarcări-0. Vizualizări-49

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