<?xml version='1.0' encoding='utf-8'?>
<CERIF xmlns='urn:xmlns:org:eurocris:cerif-1.5-1' xsi:schemaLocation='urn:xmlns:org:eurocris:cerif-1.5-1 http://www.eurocris.org/Uploads/Web%20pages/CERIF-1.5/CERIF_1.5_1.xsd' xmlns:xsi='http://www.w3.org/2001/XMLSchema-instance' release='1.5' date='2012-10-07' sourceDatabase='Output Profile'>
<cfResPubl>
<cfResPublId>ibn-ResPubl-3075</cfResPublId>
<cfResPublDate>2005-01-05</cfResPublDate>
<cfVol>4</cfVol>
<cfIssue>1</cfIssue>
<cfStartPage>102</cfStartPage>
<cfISSN>1810-648X</cfISSN>
<cfURI>https://ibn.idsi.md/ro/vizualizare_articol/3075</cfURI>
<cfTitle cfLangCode='EN' cfTrans='o'>SnO2 thin film parameter influence on gas sensitive characteristics</cfTitle>
<cfAbstr cfLangCode='EN' cfTrans='o'>In this report we present results of investigation of influence of the parameters of SnO2 thin 
film on their gas sensitive properties. SnO2 films were deposited by spray pyrolysis method.  
The  influence  of  technologic  parameters  on  concentration  of  free  electrons  n, 
stoichiometry,  thickness  d  and  gas  sensitivity  S=Rgas/Rair  was  investigated  by  means  of 
electrophysical, IR-spectroscopy and SIMS measurements. It was established  that optimal spray 
solution s composition is 0.2M, which allows depositing of SnO2  films with required parameters: 
n-1018
-1019 
cm-3, R=105
-106 

and S>10  correspondently. Obtained  results on gas  sensitivity are 
compared with results of theoretical considerations.   </cfAbstr>
<cfResPubl_Class>
<cfClassId>eda2d9e9-34c5-11e1-b86c-0800200c9a66</cfClassId>
<cfClassSchemeId>759af938-34ae-11e1-b86c-0800200c9a66</cfClassSchemeId>
<cfStartDate>2005-01-05T24:00:00</cfStartDate>
</cfResPubl_Class>
<cfResPubl_Class>
<cfClassId>e601872f-4b7e-4d88-929f-7df027b226c9</cfClassId>
<cfClassSchemeId>40e90e2f-446d-460a-98e5-5dce57550c48</cfClassSchemeId>
<cfStartDate>2005-01-05T24:00:00</cfStartDate>
</cfResPubl_Class>
<cfPers_ResPubl>
<cfPersId>ibn-person-1006</cfPersId>
<cfClassId>49815870-1cfe-11e1-8bc2-0800200c9a66</cfClassId>
<cfClassSchemeId>b7135ad0-1d00-11e1-8bc2-0800200c9a66</cfClassSchemeId>
<cfStartDate>2005-01-05T24:00:00</cfStartDate>
</cfPers_ResPubl>
<cfPers_ResPubl>
<cfPersId>ibn-person-13314</cfPersId>
<cfClassId>49815870-1cfe-11e1-8bc2-0800200c9a66</cfClassId>
<cfClassSchemeId>b7135ad0-1d00-11e1-8bc2-0800200c9a66</cfClassSchemeId>
<cfStartDate>2005-01-05T24:00:00</cfStartDate>
</cfPers_ResPubl>
<cfPers_ResPubl>
<cfPersId>ibn-person-122</cfPersId>
<cfClassId>49815870-1cfe-11e1-8bc2-0800200c9a66</cfClassId>
<cfClassSchemeId>b7135ad0-1d00-11e1-8bc2-0800200c9a66</cfClassSchemeId>
<cfStartDate>2005-01-05T24:00:00</cfStartDate>
</cfPers_ResPubl>
</cfResPubl>
<cfPers>
<cfPersId>ibn-Pers-1006</cfPersId>
<cfPersName_Pers>
<cfPersNameId>ibn-PersName-1006-3</cfPersNameId>
<cfClassId>55f90543-d631-42eb-8d47-d8d9266cbb26</cfClassId>
<cfClassSchemeId>7375609d-cfa6-45ce-a803-75de69abe21f</cfClassSchemeId>
<cfStartDate>2005-01-05T24:00:00</cfStartDate>
<cfFamilyNames>Дмитриев</cfFamilyNames>
<cfFirstNames>Сергей</cfFirstNames>
</cfPersName_Pers>
</cfPers>
<cfPers>
<cfPersId>ibn-Pers-13314</cfPersId>
<cfPersName_Pers>
<cfPersNameId>ibn-PersName-13314-3</cfPersNameId>
<cfClassId>55f90543-d631-42eb-8d47-d8d9266cbb26</cfClassId>
<cfClassSchemeId>7375609d-cfa6-45ce-a803-75de69abe21f</cfClassSchemeId>
<cfStartDate>2005-01-05T24:00:00</cfStartDate>
<cfFamilyNames>Brynzari</cfFamilyNames>
<cfFirstNames>Vladimir</cfFirstNames>
<cfFamilyNames>Брынзарь</cfFamilyNames>
<cfFirstNames>Владимир</cfFirstNames>
</cfPersName_Pers>
</cfPers>
<cfPers>
<cfPersId>ibn-Pers-122</cfPersId>
<cfPersName_Pers>
<cfPersNameId>ibn-PersName-122-3</cfPersNameId>
<cfClassId>55f90543-d631-42eb-8d47-d8d9266cbb26</cfClassId>
<cfClassSchemeId>7375609d-cfa6-45ce-a803-75de69abe21f</cfClassSchemeId>
<cfStartDate>2005-01-05T24:00:00</cfStartDate>
<cfFamilyNames>Korotchenkov</cfFamilyNames>
<cfFirstNames>Ghenadii</cfFirstNames>
<cfFamilyNames>Коротченков</cfFamilyNames>
<cfFirstNames>Геннадий</cfFirstNames>
</cfPersName_Pers>
</cfPers>
</CERIF>