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 SM ISO690:2012TSIULYANU , Dumitru, GOLBAN, G., KOLOMEYKO, Eduard, GUMENIUC, Natalia, MELNIC, O., MARIAN, Svetlana. Dimorphite based UV detectors. In: Proceedings of the International Semiconductor Conference: CAS, Ed. 19, 7-11 octombrie 1997, Sinaia. New Jersey: Institute of Electrical and Electronics Engineers Inc., 1996, Vol. 2, pp. 591-594. DOI: https://doi.org/10.1109/SMICND.1996.557455 |
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 Proceedings of the International Semiconductor Conference Vol. 2, 1996 |
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Conferința "International Semiconductor Conference" 19, Sinaia, Romania, 7-11 octombrie 1997 | ||||||
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| DOI:https://doi.org/10.1109/SMICND.1996.557455 | ||||||
| Pag. 591-594 | ||||||
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Photoelectrical properties of artificial dimorphite allow the fabrication of device structures sensitive to ultraviolet radiation. Photoconductivity spectra of these sensitive structures depend on technology of the film preparation. The result for fabricated of UV sensors are presented including experimental results for UV-dosimeter. |
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| Cuvinte-cheie photoconductivity, Semiconducting films, Semiconductor materials, Sulfide minerals, technology, Ultraviolet radiation |
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