Rusanovschi Vitalie
Publicații indexate în SCOPUS -
(1), Descărcări - 0, Vizualizări - 305
ISO 690-2012
Numeric modeling and analytical solution of ionizing irradiation induced charge in MOSFET structure oxide    |
| Rusanovschi Vitalie , Avram Adrian Adrian |
| Symposium on Electronics and Telecommunications |
| Ediția 11. 2015. New Jersey. Institute of Electrical and Electronics Engineers Inc.. 0-0. |
| Disponibil online 2 June, 2023. Descarcări-0. Vizualizări-305 |
